• Sunday,June 16,2024
ippcimedia.org
X

Focused ion beam (FIB) in situ lift-out (INLO) technique showing the

$ 5.00

5 (798) In stock

Share

76043-01

Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy

Materials, Free Full-Text

Low-Z FIB Grids for Reducing Spurious Fluorescence and X-ray

Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy

Ex situ lift-out With a Benchtop Micromanipulator - Barnett

FIB milling with liftout

Micromachines, Free Full-Text

Applied Sciences, Free Full-Text

ARES, Research, Laboratories

Micromachines, Free Full-Text

PDF) An in-situ method for protecting internal cracks/pores from

FIB Lift-Out for Defect Analysis

TEM Sample Preparation and FIB-Induced Damage - Nanolab