76043-01
Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy
Materials, Free Full-Text
Low-Z FIB Grids for Reducing Spurious Fluorescence and X-ray
Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy
Ex situ lift-out With a Benchtop Micromanipulator - Barnett
FIB milling with liftout
Micromachines, Free Full-Text
Applied Sciences, Free Full-Text
ARES, Research, Laboratories
Micromachines, Free Full-Text
PDF) An in-situ method for protecting internal cracks/pores from
FIB Lift-Out for Defect Analysis
TEM Sample Preparation and FIB-Induced Damage - Nanolab